Rapid Radiation Hardened Prototyping of Obsolescent Military Satellite Microelectronics

SBIR AF093-081

In this program, AET is performing research and development with the objective of developing the capability to rapidly fabricate substitutes of radiation hardened microcircuits for use in future military satellites that may become obsolete during the acquisition cycle. The object is to develop a methodology for rapid prototyping of these obsolescent radiation hardened military microelectronics. AET calls this the Rapid Rad-Hard Prototyping Methodology.

The outcome of this SBIR program will be to minimize the impact of cost and schedule disruptions from obsolete parts. Special attention is being given to ensuring the part will work within the power supply range of the obsolete part, and will meet the input/output voltage and current requirements of circuits with which it communicates. Attention is also being given to speed compatibility with the obsolete and qualification of the replacement part.

As a demonstration of the Rapid Rad-Hard Prototyping Methodology, AET is redesigning a Nuclear Event Detector and Circumvention Controller (NEDCC) circuit originally developed by AET for another program. This redesign uses a 0.18 micron technology run through the MOSIS fabrication organization. This NEDCC will be fabricated in two formats in the Phase II program. These parts will be electrical and radiation tested and the results compared.